Electron Microscope Accessories
Grainger Machine Vise 2-7/8 Fixed
The Dayton Machine Vise has a 2-7/8 inch jaw width and opens to a maximum width of 5 inches. It is made from high strength cast iron with a hardened steel vise screw and replaceable steel jaw plates. The vise has a 450 pound clamping force capacity. It can be mounted to a workbench or machine using the included mounting ears and hardware. The overall dimensions are 9 inches high by 7 inches wide by 5-1/2 inches deep. This is a heavy duty vise suitable for clamping metal workpieces during machining operations.
Electron Microscopy Sciences Metallurgical Mount Holder 2" and 50 mm, Hitachi M4
This mount holder which is made from machined aluminum with stainless steel Allen screws. Designed specifically for 2" and 50 mm metallurgical mounts.
Type: Hitachi M4
Ted Pella Inc 45º SEM Mount, 10/pack
45º SEM Mount Ø12.7mm for FEI, TESCAN, ZEISS (also for Philips, LEO, Cambridge, AMRAY, Leica, CamScan, ETEC) SEMs. Aluminum, grooved edge, 7.8mm pin height.
Electron Microscopy Sciences Mini SEM Clamp 10mm, 15mm dia.
Aluminum Mini SEM clamp on a 10 mm, 15 mm diameter M4 cylinder mount. Convenient for holding flat or thin specimens such as silicon chips, wires, foil and small tubes. Screw is M2 x 3 mm, pan head screw, brass.
Electron Microscopy Sciences K-kits Liquid TEM Kit, 0.2 µm Gap
An Innovative Enclosed Specimen Holder for Liquid TEM. K-kits are sample holders designed to facilitate convenient TEM observation of liquid samples, allowing nanoobjects, aggregates, and agglomerates (NOAAs) in liquid samples to be characterized. With vacuum compatible sealing of liquids in electron-transmitting thickness, K-kits are micro reaction chambers for countless experiments in materials, chemical, and biological research.
Gap: 0.2 µm
Electron Microscopy Sciences Standard Pin SEM Stub 9-Division 25 mm Head with 9 mm Pin, Aluminum, 3.2 mm Pin diameter
9 divisions surface min stub mounts are for use with FEI/Philips, ZEISS/LEO, Cambridge, Leica, Amray, Tescan and Camscan SEMs. Mounts are made from lathe finished ultra-pure aluminum.
Head: 1"
Pin height: 9 mm
Pin diameter: 3.2 mm
Electron Microscopy Sciences Calibration Standard Model 70-1D with Cert Mounted on Pin St
A precision pattern providing accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period: 70 nm pitch, one-dimensional array. Accurate to +/- 0.25 nm. Refer to calibration certificate for actual pitch. Surface: Silicon Oxide ridges on Silicon, 4x3 mm die. Ridge height (about 35 nm) and width (about 35 nm) are not calibrated. For SEM, this specimen works well at a wide range of accelerating voltages (1 kV to 20 kV have been tested) and calibrates images from 25 kX to 1000 kX.
Electron Microscopy Sciences SEM Clip M4 Cylinder Mount, 8 clips, 50 mm, 6 mm Pin height
These spring-loaded clips accommodate samples of up to 2 mm thickness. Samples are held securely by small spring-loaded clips and allow for easy change of samples. Adhesives are not required, eliminating possible outgassing issues and saving time. Available with single and multiple clips and are ideal for holding silicon chips, paper, wire, threads, thin films, sheet metal and more. SEM Clip Mounts with multiple clips can hold larger samples or multiple smaller samples.
Includes: 8 clips
Diameter: 50 mm
Pin height: 6 mm
Electron Microscopy Sciences SEM Cylinder Mount 45° Angle 1" Surface, Aluminum
Scanning electron microscope specimen mount with 45 degree angle. Made from lathe finished ultra-pure aluminum.
Head: 1"
Height: 13/16"
Electron Microscopy Sciences Thin Section Holder 3.2 mm (1⁄8") x 8mm
This mount holder which is made from machined aluminum with stainless steel Allen screws is specifically for 1" or 25 mm metallurgical mounts.
Electron Microscopy Sciences Calibration Specimen 300-1D, Steel disk for AFM
SPM calibration specimens are produced by holographic fabrication that assures high accuracy and precision. The standards provide easier testing of your SPM, improved accuracy of critical dimension measurements and accuracy of 0.5% (1 std. dev.). The pattern height of greater than 100nm provides excellent image contrast. There is uniform coverage of entire chip which allows for imaging anywhere on the chip. Parallel Ridges. Pitch 288 W-coated Photoresist on Si Use contact or Tapping Mode.
Mount: AFM
Electron Microscopy Sciences SEM Wafer Holder, 150 mm
These wafer holders are made from aluminum and feature brass clips which secure the wafers. Each holder comes with a 0.125" (3.2 mm) pin of 0.375" (9.5 mm) length. Accomodates 5" (150 mm) diameter wafer.
Size: 150 mm